Technical Equipment
The focus of the surface technology division, is on the process and equipment development for the modification, coating, or sterilization of a wide range of materials such as: metal, glass, textiles, ceramics or plastics, under normal conditions. Special attention is paid to process development of CCVD, r-CCVD and plasma CVD technologies. The classical low-pressure coating processes are also maintained and further developed.
Skills & Expertise
Abrasion Resistance | CGME | ECMC | EDX-Analysis | GDP-C | Hardness Tester | Gravimetric Titrator – Alino® | Hardness and Micro Hardness Testing | Conductivity Measurement for non-ferrous Metals | pH/Conductivity Meter | Potentiostat / Galvanostat / ZRA | Rheometer MCR 301 | X-ray Fluorescence Unit | Universal Testing Machine | Wear Test
Four-Point Measurement of Resistance | Dynamic Contact Angle Meter and Tensiometer DCAT 21 | Contact Angle Measuring Instrument OCA 15+ | Scanning Electron Microscopy | Atomic Force Microscope (AFM) | Roughness | X-ray Photoelectron Spectrometer | Admittance | Coating Thickness Gauge MiniTest 4100 | Coating Thickness Gauge Quint Sonic | Stylus Instrument Alpha-Step D600 | Stylus Instrument PGI1200 | GDOES – Glow Discharge Optical Emission Spectroscopy
Overview of the Devices
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Laboratory Electroplating
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- Wear Test




