X-Ray Fluorescence Unit Fischerscope®X-Ray XDV®-SDD
Examples of use:
- Quantitative analysis of solid, powdery or pasty materials as well as liquids for up to 24 elements from Al (Z=13) to U (Z=92)
- Measurement of layer thickness and composition of single layers and layer systems up to 24 different elements (max. 24 single layers)
- Analysis of the substrate material through cover layers is possible under certain conditions
- Line scan and raster scan are possible
- Advantages:
- simply
- quickly
Device configuration:
- Energy dispersive method
- Tungsten anode with Be-window
- Excitation voltage 10, 30 and 50 kV
- Changeable primary filters (Ni, Al, Mylar®)
- Changeable aperture [mm]: Ø 0.2, Ø 0.6, Ø 1.0, Ø 3.0
- Measuring spot size: Aperture size + approx. 10 %
- Sample chamber [mm]: 150x370x320 [HxWxL]
- Maximum movement path:
- X/Y axis [mm]: 250x250
- Z axis [mm]: 140
- Maxiumum sample weight [kg]: 20
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- Dynamic Contact Angle Meter and Tensiometer DCAT 21
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Contact Angle Measuring Instrument OCA 200
- Laboratory Electroplating
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- Wear Test
Manufacturer:
Helmut Fischer GmbH Sindelfingen
Model:
Fischerscope®X-Ray XDV®-SDD
Thomas Seemann
Surface Technology
e-mail
Phone: +49 3641 2825 62