Research Area

Surface Technology

Atomic Force Microscope (AFM)

Examples of use:

  • Examination of surface topography on surfaces (2D and 3D representations)
  • Characterization of surfaces e.g. :
    • Roughness
    • Particle distribution
    • Frictional resistance
    • Effective surface area
       
  • physical characteristics e.g. :
    • Elasticity
    • Magnetism
    • electrical conductivity

other modes on request


Device configuration:

  • Max. measuring surface: 90 x90 µm²
  • Max. lines per measurement: 4096 x 4096
  • Max. Sample diameter: 80 mm
  • Max. sample height: 30 mm

    Additional NanoRack attachment:
     
  • Measurements under tensile or compressive stress on monofilaments, wires and foils
  • Sample size (L x W x H): 41 mm (min.) x 12 mm (max.) x 6 mm (max.)
  • Maximum range of motion: 110 mm (30 mm relaxed to 147 mm fully stretched)
  • Max. load: 80 N

Overview of the Devices

Manufacturer:

Asylum Research

Model:

MFP 3D-Classic

 

Ronny Koecher

Surface Technology

e-mail
Phone: +49 3641 2825436