Examples of use:

• Examination of surface topography on surfaces (2D and 3D representations)
• Characterization of surfaces e.g. :
  • Roughness
  • Particle distribution
  • Frictional resistance
  • Effective surface area
• physical characteristics e.g. :
  • Elasticity
  • Magnetism
  • electrical conductivity

other modes on request

Device configuration:

• Max. measuring surface: 90 x90 µm²
• Max. lines per measurement: 4096 x 4096
• Max. Sample diameter: 80 mm
• Max. sample height: 30 mm
  
  Additional NanoRack attachment:
   
• Measurements under tensile or compressive stress on monofilaments, wires and foils
• Sample size (L x W x H): 41 mm (min.) x 12 mm (max.) x 6 mm (max.)
• Maximum range of motion: 110 mm (30 mm relaxed to 147 mm fully stretched)
• Max. load: 80 N