Research Area

Surface Technology

UV/VIS Spectrometer

Examples of use:

  • Transmission and turbidity measurements of liquid samples, concentration determination
  • Identification of substances active in UV/VIS
  • Determination of the layer thickness of SiOx on reflecting surfaces (0.1 - 10 mm)
  • Characterization of the absorption behavior of coatings in directional and diffuse reflection
  • Time dependent investigations (at fixed wavelengths)

Device configuration:

  • Wavelength range: 190 ... 1100 nm

Overview of the Devices


Perkin Elmer


Lambda 2

Oliver Beier

Surface Technology
Team Leader
AP Application Lab

Phone: +49 3641 282517