UV-VIS Desktop Spectrometer
Examples of use:
- UV-VIS analysis of coatings
- Acquisition of the entire spectrum for rapidly changing samples
- optical emission spectroscopy
Device configuration:
- Transmission and reflection measurement on larger samples
- Emission measurement
- Light source: UV, Vis (individually switchable)
- Measuring range 350 nm - 850 nm
- Resolution: 5 nm
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Cross-Cut Tester
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Camera - Vario THERM
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Laboratory Electroplating
- Lacquer Testing Device Carving Graver
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH Value Determination
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- Rheometer MCR 502 TDR
- Scratch Hardness Tester
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- UV-VIS Spectroscopy
- Wear Test
- Videoextensiometer RTSS
- Xenon Arc Test
- Zeta Potential Measurement
Manufacturer:
Qioptiq
Model:
UV-VIS-Desktopspektrometer
Dr. Andreas Heft
Surface Technology
e-mail
Phone: +49 3641 2825875