Scanning Electron Microscope (SEM)
Examples of use:
Imaging of high vacuum stable
- Metal surfaces
- Plastic surfaces
- Ceramic and glass surfaces
- Powders
- Biological samples
- Polished surfaces
- non-conductive surfaces after coating with carbon or metals or at very low excitation energies
Device configuration:
- Electron source: Schottky field emitter
- Detectors for imaging material contrast and topography contrast
- Resolution up to 0.7 nm (depending on sample)
- Preparation technique for non-conductive surfaces:
- High-vacuum vapor deposition system for carbon vapor deposition
- High-vacuum sputtering system for gold or platinum,
- Critical point drying preparation technique (for biological samples and samples containing water)
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- Dynamic Contact Angle Meter and Tensiometer DCAT 21
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Contact Angle Measuring Instrument OCA 200
- Laboratory Electroplating
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- Wear Test
Manufacturer:
Carl Zeiss Microscopy Germany GmbH
Model:
GeminiSEM 460 (2023)
Dr. Martina Schweder
Surface Technology
e-mail
Phone: +49 3641 2825 26