Spectral Ellipsometer SE850

Examples of use:
- Characterization of thin films on smooth surfaces
- Measurement of mixed oxide layers or layer stacks (e.g. SiO2-TiO2-SiO2-SiO2-TiO2...)
- Observation of structural changes in layers due to external influences (e.g. tempering)
Device configuration:
- Spectral ellipsometer SE850
- Wavelength range: 350 - 2300 nm
- Step scan analyser measuring principle
- Simultaneous measurement in UV-Vis and NIR range
- Microspot option with focus diameter of approx. 200µm
- Software: SpectraRay II
- Determination of the optical properties (layer thicknesses, refractive indices, absorption coefficients) of layers or layer stacks
- Numerous models for the simulation of the measured data
- Determination of roughness or interfaces (Effective Medium Approximation)
- Gradients of the refractive index (linear, exponential, Gauss)
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Cross-Cut Tester
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Camera - Vario THERM
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Laboratory Electroplating
- Lacquer Testing Device Carving Graver
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH Value Determination
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- Rheometer MCR 502 TDR
- Scratch Hardness Tester
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- UV-VIS Spectroscopy
- Wear Test
- Videoextensiometer RTSS
- Xenon Arc Test
- Zeta Potential Measurement
Manufacturer:
Sentech Instruments GmbH
Model:
Spectral ellipsometer SE850

Dr. Andreas Pfuch
Head of Department
Surface Technology
e-mail
Phone: +49 3641 2825 54