System parameters:
- DC controls with up to 1kW power input
- R.f. Sputtering on request
- Reactive and non-reactive sputtering possible
- substrate temperatures up to approx. 700 °C
- Flange and control for sample heating and rotation by Createc GmbH
- Existing targets: Ag, Al, Al2O3, Au, Ca, Ca10(OH)2(PO4)6, CaSO4, Cr, C, Cu, CuZn39Pb2 (Messing), Fe, ITO, MO, Nb, NiCr20, Si, SiO2 (SQ1), Si3N4, Sn, Ta, Ti, TiO2, W, V, Zn, ZnSe, Zr
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Cross-Cut Tester
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Camera - Vario THERM
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Laboratory Electroplating
- Lacquer Testing Device Carving Graver
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH Value Determination
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- Rheometer MCR 502 TDR
- Scratch Hardness Tester
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- UV-VIS Spectroscopy
- Wear Test
- Videoextensiometer RTSS
- Xenon Arc Test
- Zeta Potential Measurement
Dr. Andreas Pfuch
Head of Department
Surface Technology
e-mail
Phone: +49 3641 2825 54
