Atomic Force Microscopy
Atomic force microscopy (AFM) can be used to measure interactions between the sample surface and a sharp probe tip mounted on a cantilever. Thus, information about the surface structure (topography) and local material properties (e.g. hardness / rigidity or adhesion) of the sample can be obtained with extremely high resolution on nanometer scale.
For this non-destructive imaging technique, only minimal sample preparation is required and the instrument design ensures user-friendly sample access from any direction.
Gerätespezifische Daten:
- Resolution
- Lateral: up to 1 nm
- Depth resolution: < 0.3 nm
- AFM modes
- Contact mode
- AC mode
- Resonant intermittent contact mode
- Amplitude and phase imaging
- Piezo scanning stage
- Positioning accuracy
- x & y direction: < 1 nm
- z direction: < 0.2 nm
- Traverse path
- x & y direction: up to 100 µm without manual displacement of the sample
- z direction: 20 µm
- Positioning accuracy
- Comfortable adjustment and easy exchange of the cantilever
- Beam deflection module (980 nm, via single mode fiber connection)
The AFM is equipped with a Raman imaging microscope / spectroscope, so that in addition to surface analysis chemical information of the sample can be obtained. The sample does not need to be moved between the two measurements.
⇒ Please do not hesitate to contact us for questions and further information about our R&D and services offered. |
Overview of our Technical Equipment
- 3D Microscope
- Atomic Force Microscopy
- Buchholz Hardness Test
- Coater
- Coating Thickness Measurement
- Colorimeter & Spectrophotometer
- Cross Cutting Test
- Drop Ball Impact Test
- Environmental Test Engineering
- FT-IR (ATR) Spectroscopy
- Gloss Level Analysis
- Grind Gages (Grindometer)
- Irradiation Technology
- Measurement of Corrosion Current
- Mechanochemical Surface Treatment
- Mandrel Bending Test
- Palamat
- Panel Press
- Plastics Technology
- Pneumatic Hot-Melt Dispenser
- Potentiostat / Galvanostat
- Powder Coating
- Raman Spectroscopy
- Sample Preparation Technique
- Scratch & Scribing Tools
- Stirring & Mixing Technique
- TERA Ohmmeter
- Thermal Analysis
- Ultrasonic Testing System
- Universal Testing Machines
Manufacturer:
WITec Wissenschaftliche Instrumente und Technologie GmbH
Model:
alpha300 A
(combined with the Raman spectroscope alpha300 R → alpha300 RA)
Dr. Joerg Leuthaeusser
Head of Department
Primer and Chemical Surface Treatment
e-mail
Phone: +49 3641 2825 48