Research Area

Primer & Chemical Surface Treatment

Atomic Force Microscopy

Atomic force microscopy (AFM) can be used to measure interactions between the sample surface and a sharp probe tip mounted on a cantilever. Thus, information about the surface structure (topography) and local material properties (e.g. hardness / rigidity or adhesion) of the sample can be obtained with extremely high resolution on nanometer scale.

For this non-destructive imaging technique, only minimal sample preparation is required and the instrument design ensures user-friendly sample access from any direction.

Gerätespezifische Daten:

  • Resolution
    • Lateral: up to 1 nm
    • Depth resolution: < 0.3 nm
  • AFM modes
    • Contact mode
    • AC mode
    • Resonant intermittent contact mode
    • Amplitude and phase imaging
  • Piezo scanning stage
    • Positioning accuracy
      • x & y direction: < 1 nm
      • z direction: < 0.2 nm
    • Traverse path
      • x & y direction: up to 100 µm without manual displacement of the sample
      • z direction: 20 µm
  • Comfortable adjustment and easy exchange of the cantilever
  • Beam deflection module (980 nm, via single mode fiber connection)

The AFM is equipped with a Raman imaging microscope / spectroscope, so that in addition to surface analysis chemical information of the sample can be obtained. The sample does not need to be moved between the two measurements.


Please do not hesitate to contact us for questions and further information about our R&D and services offered.



WITec Wissenschaftliche Instrumente und Technologie GmbH


alpha300 A
(combined with the Raman spectroscope alpha300 R  →  alpha300 RA)

Dr. Joerg Leuthaeusser

Head of Department
Primer and Chemical Surface Treatment

Phone: +49 3641 2825 48