Form Measuring System
The Hommel-Etamic Roundscan form measurement system is used for the standard-compliant form and roughness measurement of rotationally symmetrical parts. Straightness, roundness, flatness, cylindricity, parallelism, perpendicularity, inclination, coaxiality, concentricity, axial run-out and roughness can be measured with this system on rotationally symmetrical components. Furthermore, 2-dim. roughness measurements, 2-dim. waviness measurements and swirl measurements can be carried out in predefined or self-defined measuring cycles.
Application examples:
- Macro twist analysis according to MBN 31007-7
- High-resolution microtwist analysis of cylinder surfaces
- Macro-twist and micro-twist analyses on cylinder faces
- 2-dimensional roughness measurements
Device configuration:
- Test piece geometry
- Max. Test diameter 450 mm
- Max. Measuring height 350 mm
- Max. Workpiece weight 600 N
Air bearing C-axis
- Measuring path 0° ....360°
- Centering range 5 mm
- Levelling range 1
- Angle measuring system 0.018°
Z-axis
- Measuring path 350 mm
- Displacement encoder with 0.1 µm resolution
- Straightness deviation/measurement path 0.3 µm
- Parallelism deviation C- to Z-axis 0.5 µm
R-axis
- Measuring distance 240mm
- Displacement encoder with 0.1 µm resolution
- Straightness deviation/measurement path 0.5 µm
- Squareness deviation R- to C-axis / measuring path 0.8 µm

Other Measuring Instruments
- AMR Magnetometer
- Fluxgate Magnetometer
- Hall Magnetometer
- NMR Magnetometer
- Electromagnet
- Coil Systems
- M-axis
- HyMPulse
- Rotor Measuring Station
- Magnetic Mapping
- MagHyst
- Impedance Measuring Station
- Vibration Magnetometer
- HF Measurement Technology
- Network Analyzers
- Faraday Measuring Station
- Prism Coupler
- Gonioreflectometer
- Form Measuring System
- Coordinate Measuring Machine
- Twist Tester
- CPU Cluster
- GPU Cluster
Manufacturer:
Jenoptik AG
Model:
Hommel-Etamic Roundscan 535