CMOS MagView
Quality Control of Stray Fields
The camera-based CMOS-MagView system is a testing instrument for visualizing magnetic structures. Based on magneto-optical sensor technology, the imaging process allows fast and precise stray field control of magnetic materials in the near field. With the application software, a microstructural stray field analysis can be conveniently performed using magneto-optical images.
CMOS-MagView enables local analysis of polarity, homogeneity and local stray field distribution over a sensor area of 18 x 13 mm. Visualization can be used, for example:
- Magnetic stray fields of magnetic encoders and dipole/multipole permanent magnets
- Domain structures of electrical sheets
- Information from magnetic stripe cards and magnetic inks