CMOS MagView

Quality control of stray fields

 

The camera-based CMOS-MagView system is a testing instrument for visualizing magnetic structures. Based on magneto-optical sensor technology, the imaging process allows fast and precise stray field control of magnetic materials in the near field. With the application software, a microstructural stray field analysis can be conveniently performed using magneto-optical images.
CMOS-MagView enables local analysis of polarity, homogeneity and local stray field distribution over a sensor area of 18 x 13 mm. Visualization can be used, for example:

  • Magnetic stray fields of magnetic encoders and dipole/multipole permanent magnets,
  • Domain structures of electrical sheets,
  • Information from magnetic stripe cards and magnetic inks.

 

Download CMOS-MagView S

Download CMOS-MagView specification application

Dr. Carsten Dubs

Team Leader
Crystalline Materials

E-mail

Phone: +49 3641 282564