Contact Angle Measuring Instrument OCA 200
For software-controlled measurement and analysis of
- the static and dynamic contact angle according to the Sessile & Captive Drop method
- the geometry of hanging drops using the pendant drop method
- the wetting behaviour on solid surfaces
- the surface free energy of solids and their components
- the surface and interfacial tension from the drop shape analysis
- the advancing and retreating contact angle as well as the roll-off angle of horizontal drops
consisting of
- Electronix dosing yoke (max. 4 syringe modules)
- Quadruple dosing device
- Nanodrop dosing system for measuring microstructured samples
- Measuring stage, adjustable in three axes
- Objective carrier with adjustable observation angle
- Electronic tilting device (up to 95° tilt angle)
- Sample stages with curvature or suction options for precise measurement of flexible samples
- Powerful measuring lens with 10x zoom
- Video measuring system
- LED lighting electronics
- Dpi-Max software
Overview of the Devices
- Four-Point Measurement of Resistance
- Abrasion Resistance
- Flame Treatment Units
- CGME – Controlled Growth Mercury Electrode
- Digital Microscope
- Dynamic Contact Angle Meter and Tensiometer DCAT 21
- ECMC – Electrochemical MiniCell
- EDX-Analysis
- Planar Plasma Sources
- Fluorination
- FTIR Spectroscopy
- GDP-C
- Grey Scale Measurement
- Gravimetric Titrator – Alino®
- Hardness Tester
- Hardness and Micro Hardness Testing
- Infrared Thermometer (Pyrometer)
- Jet Plasmas
- Confocal Microscope
- Contact Angle Measuring Instrument OCA 200
- Laboratory Electroplating
- Conductivity Measurement for Non-Ferrous Metals
- Optical Microscope Leica DMi8 C
- Mastersizer
- Optical Emission Spectrometer
- pH/Conductivity Meter
- Plasma Polymerization
- Potentiostat / Galvanostat / ZRA
- Contact Angle Measuring Instrument
- Scanning Electron Microscope (SEM)
- Atomic Force Microscope (AFM)
- Roughness
- Rheometer MCR 301
- X-Ray Fluorescence Unit Fischerscope
- X-Ray Photoelectron Spectrometer XPS
- Admittance
- Coating Thickness Gauge MiniTest 4100
- Coating Thickness Gauge Quint Sonic
- Sol-Gel Unit
- Spectral Ellipsometer SE850
- Sputter Technology
- Stylus Instrument / Profilometer Alpha-Step D-600
- Stylus Instrument / Profilometer PGI1200
- Thermal Evaporation
- Universal Testing Machine
- UV/VIS Spectrometer
- Wear Test
Manufacturer:
DataPhysics
Model:
OCA 200
Dr. Daniel Leichnitz
Surface Technology
e-mail
Phone: +49 3641 2825 54