CMOS-MagView XL
Quality Check of Stray Fields
The camera-based system CMOS-MagView XL is an inspection instrument for visualizing magnetic structures. Based on magneto-optical sensor technology, the imaging process allows fast and precise stray field control of magnetic materials in the near field. With the application software, a microstructural stray field analysis can be conveniently performed using magneto-optical images.
CMOS-MagView XL enables local analyses of polarity, homogeneity and local stray field distribution over a large sensor area of 54 x 38 mm. Visualization can be used, for example:
- Magnetic stray fields of magnetic encoders and dipole/multipole permanent magnets
- Domain structures of electrical sheets
- Information from magnetic stripe cards and magnetic inks