Research Area

Magnetic & Optical Systems

CMOS-MagView XL

Quality Check of Stray Fields

 

The camera-based system CMOS-MagView XL is an inspection instrument for visualizing magnetic structures. Based on magneto-optical sensor technology, the imaging process allows fast and precise stray field control of magnetic materials in the near field. With the application software, a microstructural stray field analysis can be conveniently performed using magneto-optical images.
 
CMOS-MagView XL enables local analyses of polarity, homogeneity and local stray field distribution over a large sensor area of 54 x 38 mm. Visualization can be used, for example:

  • Magnetic stray fields of magnetic encoders and dipole/multipole permanent magnets
  • Domain structures of electrical sheets
  • Information from magnetic stripe cards and magnetic inks

 

Download CMOS-MagView XL

Download CMOS-MagView specification application

Dr. Carsten Dubs

Team Leader
Crystalline Materials

e-mail
Phone: +49 3641 282564